Scaling behavior of the localization length for TE waves at critical incidence on short-range correlated stratified random media

We theoretically investigate the scaling behavior of the localization length for s-polarized electromagnetic waves incident at a critical angle on stratified random media with short-range correlated disorder. By employing the invariant embedding method, extended to waves in correlated random media,...

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Bibliographic Details
Main Authors: Seulong Kim, Kihong Kim
Format: Article
Language:English
Published: Elsevier 2024-07-01
Series:Results in Physics
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2211379724005047