Interferences of Electromagnetic Pulses on Microcontroller Units

In this study, electromagnetic interference testing of microcontroller units (MCUs) under different electromagnetic pulse (EMP) amplitudes, full width at half maximum (FWHM), and at different angles was carried out on an EMP cell. The coupling path of the radiation-type EMP experiment on the circuit...

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Bibliographic Details
Main Authors: Linjing Fan, Xudong Zu, Zhengxiang Huang
Format: Article
Language:English
Published: MDPI AG 2023-07-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/13/14/8190