Atomic resolution with high-eigenmode tapping mode atomic force microscopy
Atomic surface structure imaging is instrumental for the understanding of surface-related phenomena. Here, we show that conventional tapping mode atomic force microscopy with high cantilever eigenmodes and subnanometer amplitudes allow routine atomic imaging at atmospheric pressures. We identify the...
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2022-05-01
|
| Series: | Physical Review Research |
| Online Access: | http://doi.org/10.1103/PhysRevResearch.4.023149 |