Exploring the Performance of 3-D Nanosheet FET in Inversion and Junctionless Modes: Device and Circuit-Level Analysis and Comparison
In this article, the performance of 3-D nanosheet FET (NS-FET) in inversion (INV) and junctionless (JL) modes is demonstrated and compared at both device and circuit levels. In JL mode, the ON current (<inline-formula> <tex-math notation="LaTeX">$I_{\mathrm {ON}}$ </tex-math...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10223227/ |