Electrostatic tip-dielectric sample interaction in electrostatic force microscopy
Electric force microscopy is a local technique for measuring electrical properties of materials. The electrostatic force gradient measurements on dielectric samples are sensitive not only to the initial charge distribution in the sample but also to the charge induced by the conductive bias cantilev...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Universidad de Antioquia
2013-03-01
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| Series: | Revista Facultad de Ingeniería Universidad de Antioquia |
| Subjects: | |
| Online Access: | https://revistas.udea.edu.co/index.php/ingenieria/article/view/14929 |