Direct and Practical Identification for Back Focal Plane Based Surface Plasmon Microscopy
We propose a practical approach to identify plasmonic absorption profile on back focal plane (BFP) of surface plasmon microscopy (SPM). Compared to previous morphology approaches, the proposed one features: i) it is applicable in BFP images with non-concentricity; ii) the algorithm of Fourier Correl...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8933040/ |