Open-Set Recognition Model Based on Negative-Class Sample Feature Enhancement Learning Algorithm
In order to solve the problem that the F1-measure value and the AUROC value of some classical open-set classifier methods do not exceed 40% in high-openness scenarios, this paper proposes an algorithm combining negative-class feature enhancement learning and a Weibull distribution based on an extrem...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-12-01
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Series: | Mathematics |
Subjects: | |
Online Access: | https://www.mdpi.com/2227-7390/10/24/4725 |