Band gap and defect states of MgO thin films investigated using reflection electron energy loss spectroscopy

Band gap and defect states of MgO thin films investigated using reflection electron energy loss spectroscopy

The band gap and defect states of MgO thin films were investigated by using reflection electron energy loss spectroscopy (REELS) and high-energy resolution REELS (HR-REELS). HR-REELS with a primary electron energy of 0.3 keV revealed that the surface F center (FS) energy was located at approximately...

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Bibliographic Details
Main Authors: Sung Heo, Eunseog Cho, Hyung-Ik Lee, Gyeong Su Park, Hee Jae Kang, T. Nagatomi, Pyungho Choi, Byoung-Deog Choi
Format: Article
Language:English
Published: AIP Publishing LLC 2015-07-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4927547

Internet

http://dx.doi.org/10.1063/1.4927547

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