Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement
There has been tremendous interest in the development and deployment of Signal Processing and Machine Learning algorithms for almost all areas of instrumentation and measurement systems, starting from power systems, transportation, biomedical and healthcare, industrial measurements and automation, r...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2023-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
| Online Access: | https://ieeexplore.ieee.org/document/10352322/ |