Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement
There has been tremendous interest in the development and deployment of Signal Processing and Machine Learning algorithms for almost all areas of instrumentation and measurement systems, starting from power systems, transportation, biomedical and healthcare, industrial measurements and automation, r...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2023-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
| Online Access: | https://ieeexplore.ieee.org/document/10352322/ |
| _version_ | 1797197378011267072 |
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| author | Anirban Mukherjee Rajarshi Gupta Amitava Chatterjee |
| author_facet | Anirban Mukherjee Rajarshi Gupta Amitava Chatterjee |
| author_sort | Anirban Mukherjee |
| collection | DOAJ |
| description | There has been tremendous interest in the development and deployment of Signal Processing and Machine Learning algorithms for almost all areas of instrumentation and measurement systems, starting from power systems, transportation, biomedical and healthcare, industrial measurements and automation, robotics and mechatronics, smart infrastructure, and facility management to aerospace and navigation. Their combination, signal processing and machine learning, is expected to dominate the next decade industrial developments. In order to embed the “intelligence” into the measurement, signal processing has been one of the ubiquitous techniques for quite some time. Machine learning methods make these intelligent methods “experienced.” Because machine learning has been around in recent years, signal processing software–hardware systems equipped with machine learning are relatively mature. In this Special Section, a call for paper included (but were not limited to) the following areas. |
| first_indexed | 2024-04-24T06:43:00Z |
| format | Article |
| id | doaj.art-25568c5cf44a4f2094bf547eb1ba6131 |
| institution | Directory Open Access Journal |
| issn | 2768-7236 |
| language | English |
| last_indexed | 2024-04-24T06:43:00Z |
| publishDate | 2023-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Open Journal of Instrumentation and Measurement |
| spelling | doaj.art-25568c5cf44a4f2094bf547eb1ba61312024-04-22T20:23:45ZengIEEEIEEE Open Journal of Instrumentation and Measurement2768-72362023-01-0121210.1109/OJIM.2023.333482710352322Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and MeasurementAnirban Mukherjee0Rajarshi Gupta1https://orcid.org/0000-0001-5964-7683Amitava Chatterjee2https://orcid.org/0000-0002-2577-8930Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, IndiaDepartment of Applied Physics, University of Calcutta, Kolkata, IndiaDepartment of Electrical Engineering, Jadavpur University, Kolkata, IndiaThere has been tremendous interest in the development and deployment of Signal Processing and Machine Learning algorithms for almost all areas of instrumentation and measurement systems, starting from power systems, transportation, biomedical and healthcare, industrial measurements and automation, robotics and mechatronics, smart infrastructure, and facility management to aerospace and navigation. Their combination, signal processing and machine learning, is expected to dominate the next decade industrial developments. In order to embed the “intelligence” into the measurement, signal processing has been one of the ubiquitous techniques for quite some time. Machine learning methods make these intelligent methods “experienced.” Because machine learning has been around in recent years, signal processing software–hardware systems equipped with machine learning are relatively mature. In this Special Section, a call for paper included (but were not limited to) the following areas.https://ieeexplore.ieee.org/document/10352322/ |
| spellingShingle | Anirban Mukherjee Rajarshi Gupta Amitava Chatterjee Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement IEEE Open Journal of Instrumentation and Measurement |
| title | Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement |
| title_full | Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement |
| title_fullStr | Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement |
| title_full_unstemmed | Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement |
| title_short | Guest Editorial Special Section on Signal Processing and Machine Learning in Intelligent Instrumentation, IEEE Open Journal of Instrumentation and Measurement |
| title_sort | guest editorial special section on signal processing and machine learning in intelligent instrumentation ieee open journal of instrumentation and measurement |
| url | https://ieeexplore.ieee.org/document/10352322/ |
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