CHARGE DISTRIBUTION IN THE Al2O3-SiO2 SYSTEM EXPOSED TO IONIZING RADIATION
Metal-insulator-semiconductor (MIS) structures are key elements of modern electronic technology, including devices operating under conditions of exposure to penetrating radiation. One of the possible approaches to reducing radiation effects in MIS structures is the use of dielectrics, which reduce t...
| Main Authors: | , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Tver State University
2021-12-01
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| Series: | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| Subjects: | |
| Online Access: | https://physchemaspects.ru/2021/doi-10-26456-pcascnn-2021-13-329/?lang=en |