Entropy-Based Combined Metric for Automatic Objective Quality Assessment of Stitched Panoramic Images

Quality assessment of stitched images is an important element of many virtual reality and remote sensing applications where the panoramic images may be used as a background as well as for navigation purposes. The quality of stitched images may be decreased by several factors, including geometric dis...

全面介绍

书目详细资料
Main Authors: Krzysztof Okarma, Wojciech Chlewicki, Mateusz Kopytek, Beata Marciniak, Vladimir Lukin
格式: 文件
语言:English
出版: MDPI AG 2021-11-01
丛编:Entropy
主题:
在线阅读:https://www.mdpi.com/1099-4300/23/11/1525