In-depth component distribution in electrodeposited alloys and multilayers

In-depth component distribution in electrodeposited alloys and multilayers

It is shown in this overview that modern composition depth profiling methods like secondary neutral mass spectroscopy (SNMS) and glow-discharge – time-of-flight mass spectrometry (GD-ToFMS) can be used to gain highly specific composition depth profile information on electrodeposited alloys. In some...

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Bibliographic Details
Main Authors: László Péter, Kálmán Vad, Attila Csik, Rocío Muñíz, Lara Lobo, Rosario Pereiro, SaÅ¡o Å turm, Kristina Žužek Rožman, György Molnár, Katalin Németh, Katalin Neuróhr, Krisztina Boros, Lajos Pogány, Imre Bakonyi
Format: Article
Language:English
Published: International Association of Physical Chemists (IAPC) 2018-03-01
Series:Journal of Electrochemical Science and Engineering
Subjects:
Alloy formation
near-substrate composition modulation
hydrodynamic conditions
component distribution correlations
Online Access:http://pub.iapchem.org/ojs/index.php/JESE/article/view/480

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http://pub.iapchem.org/ojs/index.php/JESE/article/view/480

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