BIST controller design with high-level synthesis
MBIST(Memory Built-In Self-Test) technology has extensive application in the memory test. In view of the traditional BIST controller register transfer level description language design process is relatively complicated, special flexibility EDA tools to define algorithm flexibility is poor, and the c...
Main Authors: | , , , , , |
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Format: | Article |
Language: | zho |
Published: |
National Computer System Engineering Research Institute of China
2018-08-01
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Series: | Dianzi Jishu Yingyong |
Subjects: | |
Online Access: | http://www.chinaaet.com/article/3000088032 |