BIST controller design with high-level synthesis

MBIST(Memory Built-In Self-Test) technology has extensive application in the memory test. In view of the traditional BIST controller register transfer level description language design process is relatively complicated, special flexibility EDA tools to define algorithm flexibility is poor, and the c...

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Bibliographic Details
Main Authors: Cai Hongyan, Du Tao, Meng Xianggang, Li Guofeng, Liang Ke, Chen Xinwei
Format: Article
Language:zho
Published: National Computer System Engineering Research Institute of China 2018-08-01
Series:Dianzi Jishu Yingyong
Subjects:
Online Access:http://www.chinaaet.com/article/3000088032