Combined synchrotron x-ray diffraction and NV diamond magnetic microscopy measurements at high pressure

Combined synchrotron x-ray diffraction and NV diamond magnetic microscopy measurements at high pressure

We report the possibility to simultaneously perform wide-field nitrogen-vacancy (NV) diamond magnetic microscopy and synchrotron x-ray diffraction measurements at high pressure. NV color centers are created on the culet of a diamond anvil which is integrated in a diamond anvil cell for static compre...

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Bibliographic Details
Main Authors: Loïc Toraille, Antoine Hilberer, Thomas Plisson, Margarita Lesik, Mayeul Chipaux, Baptiste Vindolet, Charles Pépin, Florent Occelli, Martin Schmidt, Thierry Debuisschert, Nicolas Guignot, Jean-Paul Itié, Paul Loubeyre, Jean-François Roch
Format: Article
Language:English
Published: IOP Publishing 2020-01-01
Series:New Journal of Physics
Subjects:
diamond
NV center
diamond anvil cell
magnetometry
synchrotron x-ray diffraction
iron
Online Access:https://doi.org/10.1088/1367-2630/abc28f

Internet

https://doi.org/10.1088/1367-2630/abc28f

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