A novel approach to measuring local mechanical properties via photothermal excitation of an atomic force microscope probe using an optical pump–probe inspired design

Obtaining and improving measurements of mechanical properties at the nanoscale has been made possible through the continuous advancement of atomic force microscopy (AFM) techniques over the past several decades. Among these advancements include implementing multifunctional AFM probes and developing...

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Bibliographic Details
Main Authors: Devon A. Eichfeld, Rinu Abraham Maniyara, Joshua A. Robinson, Brian M. Foley, Bladimir Ramos-Alvarado
Format: Article
Language:English
Published: AIP Publishing LLC 2023-10-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0151801