Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples–Kinetics of Photocurrent (PC)

Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples–Kinetics of Photocurrent (PC)

Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility-lifetime product, <i>μτ</i>. We show for the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treat...

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Bibliographic Details
Main Authors: Andrzej Mycielski, Dominika M. Kochanowska, Aneta Wardak, Krzysztof Gościński, Michał Szot, Witold Dobrowolski, Gabriela Janusz, Małgorzata Górska, Łukasz Janiak, Wiesław Czarnacki, Łukasz Świderski, Joanna Iwanowska-Hanke, Marek Moszyński
Format: Article
Language:English
Published: MDPI AG 2022-04-01
Series:Sensors
Subjects:
CdMnTe
surface defects
etching
carrier mobility-lifetime product
Online Access:https://www.mdpi.com/1424-8220/22/8/2941

Internet

https://www.mdpi.com/1424-8220/22/8/2941

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