Local structure analysis of disordered materials via contrast variation in scanning transmission electron microscopy

Local structure analysis of disordered materials via contrast variation in scanning transmission electron microscopy

The crystallographic structures of disordered materials are typically analyzed using diffractometry techniques, such as x-ray diffraction (XRD), neutron diffraction (ND), and electron diffraction (ED). Here, we demonstrate a novel technique to analyze the local structure of disordered materials via...

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Bibliographic Details
Main Authors: Koji Kimoto, Motoki Shiga, Shinji Kohara, Jun Kikkawa, Ovidiu Cretu, Yohei Onodera, Kazuo Ishizuka
Format: Article
Language:English
Published: AIP Publishing LLC 2022-09-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0104798

Internet

http://dx.doi.org/10.1063/5.0104798

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