Structural Properties of Silicon Doped Rare Earth Elements Ytterbium

Structural Properties of Silicon Doped Rare Earth Elements Ytterbium

This paper presents the results of a study of the state of ytterbium atoms in silicon, carried out using the methods of Fourier transform infrared spectroscopy (IR) and Raman spectroscopy (RS). Silicon samples doped with ytterbium impurities were analyzed using FSM-2201 and SENTERRA II Bruker spectr...

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Bibliographic Details
Main Authors: Khodjakbar S. Daliev, Sharifa B. Utamuradova, Jonibek J. Khamdamov, Mansur B. Bekmuratov
Format: Article
Language:English
Published: V.N. Karazin Kharkiv National University Publishing 2024-03-01
Series:East European Journal of Physics
Subjects:
silicon
ytterbium
rare earth elements
raman
diffusion
thermal coolant
temperature
Online Access:https://periodicals.karazin.ua/eejp/article/view/23055

Internet

https://periodicals.karazin.ua/eejp/article/view/23055

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