Device Status Evaluation Method Based on Deep Learning for PHM Scenarios

The emergence of fault prediction and health management (PHM) technology has proposed a new solution and is suitable for implementing the functions of improving the intelligent management and control system. However, the research and application of the PHM model in the intelligent management and con...

Full description

Bibliographic Details
Main Authors: Pengjun Wang, Jiahao Qin, Jiucheng Li, Meng Wu, Shan Zhou, Le Feng
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/12/3/779