Integrating 2D layered materials with 3D bulk materials as van der Waals heterostructures for photodetections: Current status and perspectives

Integrating 2D layered materials with 3D bulk materials as van der Waals heterostructures for photodetections: Current status and perspectives

Abstract In the last decade, two‐dimensional layered materials (2DLMs) have been drawing extensive attentions due to their unique properties, such as absence of surface dangling bonds, thickness‐dependent bandgap, high absorption coefficient, large specific surface area, and so on. But the high‐qual...

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Bibliographic Details
Main Authors: Weijie Liu, Yiye Yu, Meng Peng, Zhihua Zheng, Pengcheng Jian, Yang Wang, Yuanchen Zou, Yongming Zhao, Fang Wang, Feng Wu, Changqing Chen, Jiangnan Dai, Peng Wang, Weida Hu
Format: Article
Language:English
Published: Wiley 2023-10-01
Series:InfoMat
Subjects:
photodetectors
three‐dimensional semiconductors
two‐dimensional layered materials
van der Waals heterostructures
Online Access:https://doi.org/10.1002/inf2.12470

Internet

https://doi.org/10.1002/inf2.12470

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