A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories

A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories

Data randomization has been a widely adopted Flash Signal Processing technique for reducing or suppressing errors since the inception of mass storage platforms based on planar NAND Flash technology. However, the paradigm change represented by the 3D memory integration concept has complicated the ran...

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Bibliographic Details
Main Authors: Michele Favalli, Cristian Zambelli, Alessia Marelli, Rino Micheloni, Piero Olivo
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Micromachines
Subjects:
3D NAND Flash
RBER
reliability
flash signal processing
randomization scheme
Online Access:https://www.mdpi.com/2072-666X/12/7/759

Internet

https://www.mdpi.com/2072-666X/12/7/759

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