NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES
The technique for numerical simulation of digital VLSI total dose failures is presented, based on fuzzy logic sets theory. It assumes transfer from boolean logic model of a VLSI with values {0,1} to fuzzy model with continuous interval [0,1], and from boolean logic functions to continuous minimax fu...
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| Format: | Article |
| Language: | English |
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Joint Stock Company "Experimental Scientific and Production Association SPELS
2016-10-01
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| Series: | Безопасность информационных технологий |
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| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/15 |