NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES
The technique for numerical simulation of digital VLSI total dose failures is presented, based on fuzzy logic sets theory. It assumes transfer from boolean logic model of a VLSI with values {0,1} to fuzzy model with continuous interval [0,1], and from boolean logic functions to continuous minimax fu...
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| Format: | Article |
| Language: | English |
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Joint Stock Company "Experimental Scientific and Production Association SPELS
2016-10-01
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| Series: | Безопасность информационных технологий |
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| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/15 |
| _version_ | 1797707975085785088 |
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| author | O. A. Kalashnikov |
| author_facet | O. A. Kalashnikov |
| author_sort | O. A. Kalashnikov |
| collection | DOAJ |
| description | The technique for numerical simulation of digital VLSI total dose failures is presented, based on fuzzy logic sets theory. It assumes transfer from boolean logic model of a VLSI with values {0,1} to fuzzy model with continuous interval [0,1], and from boolean logic functions to continuous minimax functions. The technique is realized as a calculation system and allows effective estimating of digital VLSI radiation behavior without experimental investigation. |
| first_indexed | 2024-03-12T06:14:27Z |
| format | Article |
| id | doaj.art-28ab8f28a74049da88c1cea71bd3bdaf |
| institution | Directory Open Access Journal |
| issn | 2074-7128 2074-7136 |
| language | English |
| last_indexed | 2024-03-12T06:14:27Z |
| publishDate | 2016-10-01 |
| publisher | Joint Stock Company "Experimental Scientific and Production Association SPELS |
| record_format | Article |
| series | Безопасность информационных технологий |
| spelling | doaj.art-28ab8f28a74049da88c1cea71bd3bdaf2023-09-03T02:40:15ZengJoint Stock Company "Experimental Scientific and Production Association SPELSБезопасность информационных технологий2074-71282074-71362016-10-01233303415NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURESO. A. Kalashnikov0National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)The technique for numerical simulation of digital VLSI total dose failures is presented, based on fuzzy logic sets theory. It assumes transfer from boolean logic model of a VLSI with values {0,1} to fuzzy model with continuous interval [0,1], and from boolean logic functions to continuous minimax functions. The technique is realized as a calculation system and allows effective estimating of digital VLSI radiation behavior without experimental investigation.https://bit.mephi.ru/index.php/bit/article/view/15VLSItotal dose failuresfunctional-logical simulation |
| spellingShingle | O. A. Kalashnikov NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES Безопасность информационных технологий VLSI total dose failures functional-logical simulation |
| title | NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES |
| title_full | NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES |
| title_fullStr | NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES |
| title_full_unstemmed | NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES |
| title_short | NUMERICAL SIMULATION OF DIGITAL VLSI TOTAL DOSE FUNCTIONAL FAILURES |
| title_sort | numerical simulation of digital vlsi total dose functional failures |
| topic | VLSI total dose failures functional-logical simulation |
| url | https://bit.mephi.ru/index.php/bit/article/view/15 |
| work_keys_str_mv | AT oakalashnikov numericalsimulationofdigitalvlsitotaldosefunctionalfailures |