Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors. Transmission electron microscopy (TEM) confirmed the bilayer configuration of the CZTSe/Cu _...

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Bibliographic Details
Main Authors: Manoj Vishwakarma, Deepak Varandani, Mylene Hendrickx, Joke Hadermann, B R Mehta
Format: Article
Language:English
Published: IOP Publishing 2020-01-01
Series:Materials Research Express
Subjects:
Kesterite
secondary phases
KPFM
surface potential
interface
photovoltage
Online Access:https://doi.org/10.1088/2053-1591/ab65e6

Internet

https://doi.org/10.1088/2053-1591/ab65e6

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