Analysis of Electrothermal Effects in Devices and Arrays in InGaP/GaAs HBT Technology
In this paper, the dc electrothermal behavior of InGaP/GaAs HBT test devices and arrays for power amplifier output stages is extensively analyzed through an efficient simulation approach. The approach relies on a full circuit representation of the domains, which accounts for electrothermal effects t...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-03-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/10/6/757 |