Evaluation and Mitigation of Weight-Related Single Event Upsets in a Convolutional Neural Network

Evaluation and Mitigation of Weight-Related Single Event Upsets in a Convolutional Neural Network

Single Event Upsets (SEUs) are most likely to cause bit flips within the trained parameters of a convolutional neural network (CNN). Therefore, it is crucial to analyze and implement hardening techniques to enhance their reliability under radiation. In this paper, random fault injections into the we...

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Bibliographic Details
Main Authors: Yulong Cai, Ming Cai, Yanlai Wu, Jian Lu, Zeyu Bian, Bingkai Liu, Shuai Cui
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Electronics
Subjects:
reliability
SEU
CNN
weight
Online Access:https://www.mdpi.com/2079-9292/13/7/1296

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https://www.mdpi.com/2079-9292/13/7/1296

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