The Influence of Capping Layers on Tunneling Magnetoresistance and Microstructure in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions upon Annealing

This study investigates the effects of annealing on the tunnel magnetoresistance (TMR) ratio in CoFeB/MgO/CoFeB-based magnetic tunnel junctions (MTJs) with different capping layers and correlates them with microstructural changes. It is found that the capping layer plays an important role in determi...

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Bibliographic Details
Main Authors: Geunwoo Kim, Soogil Lee, Sanghwa Lee, Byonggwon Song, Byung-Kyu Lee, Duhyun Lee, Jin Seo Lee, Min Hyeok Lee, Young Keun Kim, Byong-Guk Park
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/13/18/2591