Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements

Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements

The minimum information requirements needed to guarantee high-quality surface analysis data of nanomaterials are described with the aim to provide reliable and traceable information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface...

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Bibliographic Details
Main Authors: Jörg Radnik, Reinhard Kersting, Birgit Hagenhoff, Francesca Bennet, Dmitri Ciornii, Penny Nymark, Roland Grafström, Vasile-Dan Hodoroaba
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Nanomaterials
Subjects:
surface analysis
electron microscopy
energy dispersive X-ray spectroscopy (EDS)
X-ray photoelectron spectroscopy (XPS)
secondary ion mass spectrometry (SIMS)
standardization
Online Access:https://www.mdpi.com/2079-4991/11/3/639

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https://www.mdpi.com/2079-4991/11/3/639

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