Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements
The minimum information requirements needed to guarantee high-quality surface analysis data of nanomaterials are described with the aim to provide reliable and traceable information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-03-01
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| Series: | Nanomaterials |
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| Online Access: | https://www.mdpi.com/2079-4991/11/3/639 |
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| author | Jörg Radnik Reinhard Kersting Birgit Hagenhoff Francesca Bennet Dmitri Ciornii Penny Nymark Roland Grafström Vasile-Dan Hodoroaba |
| author_facet | Jörg Radnik Reinhard Kersting Birgit Hagenhoff Francesca Bennet Dmitri Ciornii Penny Nymark Roland Grafström Vasile-Dan Hodoroaba |
| author_sort | Jörg Radnik |
| collection | DOAJ |
| description | The minimum information requirements needed to guarantee high-quality surface analysis data of nanomaterials are described with the aim to provide reliable and traceable information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO<sub>2</sub> reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community. |
| first_indexed | 2024-03-09T05:28:05Z |
| format | Article |
| id | doaj.art-2a1600dd7f824778b28bae272a9d3a1b |
| institution | Directory Open Access Journal |
| issn | 2079-4991 |
| language | English |
| last_indexed | 2024-03-09T05:28:05Z |
| publishDate | 2021-03-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Nanomaterials |
| spelling | doaj.art-2a1600dd7f824778b28bae272a9d3a1b2023-12-03T12:34:52ZengMDPI AGNanomaterials2079-49912021-03-0111363910.3390/nano11030639Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information RequirementsJörg Radnik0Reinhard Kersting1Birgit Hagenhoff2Francesca Bennet3Dmitri Ciornii4Penny Nymark5Roland Grafström6Vasile-Dan Hodoroaba7Bundesanstalt für Materialforschung und-Prüfung (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Unter den Eichen 87, 12205 Berlin, GermanyTascon GmbH, Mendelstr. 17, 48149 Münster, GermanyTascon GmbH, Mendelstr. 17, 48149 Münster, GermanyBundesanstalt für Materialforschung und-Prüfung (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Unter den Eichen 87, 12205 Berlin, GermanyBundesanstalt für Materialforschung und-Prüfung (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Unter den Eichen 87, 12205 Berlin, GermanyDepartment of Toxicology, Misvik Biology, Karjakatu 35, 20520 Turku, FinlandDepartment of Toxicology, Misvik Biology, Karjakatu 35, 20520 Turku, FinlandBundesanstalt für Materialforschung und-Prüfung (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Unter den Eichen 87, 12205 Berlin, GermanyThe minimum information requirements needed to guarantee high-quality surface analysis data of nanomaterials are described with the aim to provide reliable and traceable information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO<sub>2</sub> reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community.https://www.mdpi.com/2079-4991/11/3/639surface analysiselectron microscopyenergy dispersive X-ray spectroscopy (EDS)X-ray photoelectron spectroscopy (XPS)secondary ion mass spectrometry (SIMS)standardization |
| spellingShingle | Jörg Radnik Reinhard Kersting Birgit Hagenhoff Francesca Bennet Dmitri Ciornii Penny Nymark Roland Grafström Vasile-Dan Hodoroaba Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements Nanomaterials surface analysis electron microscopy energy dispersive X-ray spectroscopy (EDS) X-ray photoelectron spectroscopy (XPS) secondary ion mass spectrometry (SIMS) standardization |
| title | Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements |
| title_full | Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements |
| title_fullStr | Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements |
| title_full_unstemmed | Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements |
| title_short | Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements |
| title_sort | reliable surface analysis data of nanomaterials in support of risk assessment based on minimum information requirements |
| topic | surface analysis electron microscopy energy dispersive X-ray spectroscopy (EDS) X-ray photoelectron spectroscopy (XPS) secondary ion mass spectrometry (SIMS) standardization |
| url | https://www.mdpi.com/2079-4991/11/3/639 |
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