Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy

The noncontact electrical discharge grinding technique has the potential to effectively grind thin, increasingly large-diameter wafers. This study proposes a bipolar electrical discharge machining (bipolar-EDM) method to realize the intergrinding of dual wafers, in which both wafers serve as the wor...

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Main Authors: Junming Guan, Yonghua Zhao
Format: Article
Language:English
Published: Elsevier 2022-09-01
Series:Results in Engineering
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590123022001967
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author Junming Guan
Yonghua Zhao
author_facet Junming Guan
Yonghua Zhao
author_sort Junming Guan
collection DOAJ
description The noncontact electrical discharge grinding technique has the potential to effectively grind thin, increasingly large-diameter wafers. This study proposes a bipolar electrical discharge machining (bipolar-EDM) method to realize the intergrinding of dual wafers, in which both wafers serve as the working electrode. A capacity-coupled (CC-type) pulse generator generates regular and identical bipolar discharges, ensuring symmetrical and stable removal of both wafers. Thus, both the energy efficiency and wafer thinning yield are doubled. The process characteristics are evaluated through equivalent circuit analysis and experiments, demonstrating that two thinned wafers exhibit high consistency in surface integrity and material removal rate (MRR). Moreover, the dual-wafer system causes an increase in the circuit resistance and gap capacitance, leading to a much lower discharge energy. This is beneficial for precision wafer grinding and thinning by electrical discharge machining (EDM) while keeping damage minimal. As a result, two Φ20 mm 4H–SiC wafers were thinned simultaneously with a maximum thinning rate of 3 μm/min. A mirror-like smooth surface (Ra < 80 nm) was obtained under finishing conditions, demonstrating its capability for precise wafer processing.
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spelling doaj.art-2a33ec3644d444e6afc708072260f9e42022-12-22T03:47:31ZengElsevierResults in Engineering2590-12302022-09-0115100526Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energyJunming Guan0Yonghua Zhao1Department of Mechanical and Energy Engineering, Southern University of Science and Technology, Shenzhen, 518055, ChinaCorresponding author.; Department of Mechanical and Energy Engineering, Southern University of Science and Technology, Shenzhen, 518055, ChinaThe noncontact electrical discharge grinding technique has the potential to effectively grind thin, increasingly large-diameter wafers. This study proposes a bipolar electrical discharge machining (bipolar-EDM) method to realize the intergrinding of dual wafers, in which both wafers serve as the working electrode. A capacity-coupled (CC-type) pulse generator generates regular and identical bipolar discharges, ensuring symmetrical and stable removal of both wafers. Thus, both the energy efficiency and wafer thinning yield are doubled. The process characteristics are evaluated through equivalent circuit analysis and experiments, demonstrating that two thinned wafers exhibit high consistency in surface integrity and material removal rate (MRR). Moreover, the dual-wafer system causes an increase in the circuit resistance and gap capacitance, leading to a much lower discharge energy. This is beneficial for precision wafer grinding and thinning by electrical discharge machining (EDM) while keeping damage minimal. As a result, two Φ20 mm 4H–SiC wafers were thinned simultaneously with a maximum thinning rate of 3 μm/min. A mirror-like smooth surface (Ra < 80 nm) was obtained under finishing conditions, demonstrating its capability for precise wafer processing.http://www.sciencedirect.com/science/article/pii/S25901230220019674H–SiCWafer grinding/thinningBipolar electrical discharge machiningCapacity-coupled pulse generatorCircuit analysis
spellingShingle Junming Guan
Yonghua Zhao
Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy
Results in Engineering
4H–SiC
Wafer grinding/thinning
Bipolar electrical discharge machining
Capacity-coupled pulse generator
Circuit analysis
title Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy
title_full Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy
title_fullStr Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy
title_full_unstemmed Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy
title_short Dual-wafer intergrinding thinning by bipolar-discharge EDM with a capacity-coupled pulse generator considering large gap capacitance and minimization of discharge energy
title_sort dual wafer intergrinding thinning by bipolar discharge edm with a capacity coupled pulse generator considering large gap capacitance and minimization of discharge energy
topic 4H–SiC
Wafer grinding/thinning
Bipolar electrical discharge machining
Capacity-coupled pulse generator
Circuit analysis
url http://www.sciencedirect.com/science/article/pii/S2590123022001967
work_keys_str_mv AT junmingguan dualwaferintergrindingthinningbybipolardischargeedmwithacapacitycoupledpulsegeneratorconsideringlargegapcapacitanceandminimizationofdischargeenergy
AT yonghuazhao dualwaferintergrindingthinningbybipolardischargeedmwithacapacitycoupledpulsegeneratorconsideringlargegapcapacitanceandminimizationofdischargeenergy