Reversible displacive transformation in MnTe polymorphic semiconductor

Designing low power consumption and fast operation electronic phase-change devices remains a challenge. Here, the authors demonstrate the reversible displacive transformation in polycrystalline MnTe films to enable resistive switching via fast Joule heating for fast nonvolatile memory applications.

Détails bibliographiques
Auteurs principaux: Shunsuke Mori, Shogo Hatayama, Yi Shuang, Daisuke Ando, Yuji Sutou
Format: Article
Langue:English
Publié: Nature Portfolio 2020-01-01
Collection:Nature Communications
Accès en ligne:https://doi.org/10.1038/s41467-019-13747-5