Electron Traps in GaAs Grown by Molecular Beam Epitaxy on On-axis (100) and Off-axis Substrates
Deep level transient spectroscopy (DLTS) was used to characterize the electron traps present in the bulkGaAs grown by molecular beam epitaxy (MBE) on on-axis (100) and off-axis (4° towards the (111) Adirection) substrates. Two electron traps were obtained for each sample having identical correspondi...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
University of the Philippines
2003-06-01
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Series: | Science Diliman |
Subjects: | |
Online Access: | http://journals.upd.edu.ph/index.php/sciencediliman/article/view/125/116 |