An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

An error in Fig. 3(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.

Bibliographic Details
Main Authors:	Dameli Assalauova, Young Yong Kim, Sergey Bobkov, Ruslan Khubbutdinov, Max Rose, Roberto Alvarez, Jakob Andreasson, Eugeniu Balaur, Alice Contreras, Hasan DeMirci, Luca Gelisio, Janos Hajdu, Mark S. Hunter, Ruslan P. Kurta, Haoyuan Li, Matthew McFadden, Reza Nazari, Peter Schwander, Anton Teslyuk, Peter Walter, P. Lourdu Xavier, Chun Hong Yoon, Sahba Zaare, Viacheslav A. Ilyin, Richard A. Kirian, Brenda G. Hogue, Andrew Aquila, Ivan A. Vartanyants
Format:	Article
Language:	English
Published:	International Union of Crystallography 2022-03-01
Series:	IUCrJ
Subjects:	coherent x-ray diffractive imaging (cxdi) free-electron lasers single particles xfel
Online Access:	http://scripts.iucr.org/cgi-bin/paper?S2052252522000501

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