Invariant Pattern Recognition with Log-Polar Transform and Dual-Tree Complex Wavelet-Fourier Features

In this paper, we propose a novel method for 2D pattern recognition by extracting features with the log-polar transform, the dual-tree complex wavelet transform (DTCWT), and the 2D fast Fourier transform (FFT2). Our new method is invariant to translation, rotation, and scaling of the input 2D patter...

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Bibliographic Details
Main Authors: Guangyi Chen, Adam Krzyzak
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/8/3842