Direct Observation of Contact Electrification Effects at Nanoscale Using Scanning Probe Microscopy

Direct Observation of Contact Electrification Effects at Nanoscale Using Scanning Probe Microscopy

Abstract In the last decade, contact electrification has gained attention for its potential in energy harvesting, addressing fundamental physics. Scanning probe microscopy (SPM) has evolved as a powerful platform, enabling the in situ characterization/manipulation of a sample's tribological/ele...

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Bibliographic Details
Main Authors: Jong Hun Kim, Jinhyeok Jeong, Dae Sol Kong, HongYeon Yoon, Hunyoung Cho, Jong Hoon Jung, Jeong Young Park
Format: Article
Language:English
Published: Wiley-VCH 2024-02-01
Series:Advanced Materials Interfaces
Subjects:
contact electrification
energy dissipation
friction
scanning probe microscopy
triboelectric nanogenerator
tribo‐electrification
Online Access:https://doi.org/10.1002/admi.202300821

Internet

https://doi.org/10.1002/admi.202300821

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