Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography

Optimization Method to Predict Optimal Noise Reduction Parameters for the Non-Local Means Algorithm Based on the Scintillator Thickness in Radiography

The resulting image obtained from an X-ray imaging system depends significantly on the characteristics of the detector. In particular, when an X-ray image is acquired by thinning the detector, a relatively large amount of noise inevitably occurs. In addition, when a thick detector is used to reduce...

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Hlavní autoři: Bo Kyung Cha, Kyeong-Hee Lee, Youngjin Lee, Kyuseok Kim
Médium: Článek
Jazyk:English
Vydáno: MDPI AG 2023-12-01
Edice:Sensors
Témata:
noise reduction
parameter optimization
scintillator thickness
image restoration
non-local means (NLM) method
image quality assessment
On-line přístup:https://www.mdpi.com/1424-8220/23/24/9803

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https://www.mdpi.com/1424-8220/23/24/9803

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