Multidimensional optomechanical cantilevers for high-frequency force sensing
High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high-speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and therefore the frequency, of the cantilever—ultimately setting...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2014-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/16/3/035001 |