Anomaly Detection in WAAM Deposition of Nickel Alloys—Single-Material and Cross-Material Analysis

The current research work investigates the possibility of using machine learning models to deduce the relationship between WAAM (wire arc additive manufacturing) sensor responses and defect presence in the printed part. The work specifically focuses on three materials from the nickel alloy family (I...

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Bibliographic Details
Main Authors: Aditya Rajesh, Wei Ya, Marcel Hermans
Format: Article
Language:English
Published: MDPI AG 2023-10-01
Series:Metals
Subjects:
Online Access:https://www.mdpi.com/2075-4701/13/11/1820