A New Method to Determine the Optimal Thin Layer Ionospheric Height and Its Application in the Polar Regions

The conversion between the line-of-sight slant total electron content (STEC) and the vertical total electron content (VTEC) depends on the mapping function (MF) under the widely used thin layer ionospheric model. The thin layer ionospheric height (TLIH) is an essential parameter of the MF, which aff...

Full description

Bibliographic Details
Main Authors: Hu Jiang, Shuanggen Jin, Manuel Hernández-Pajares, Hui Xi, Jiachun An, Zemin Wang, Xueyong Xu, Houxuan Yan
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Remote Sensing
Subjects:
Online Access:https://www.mdpi.com/2072-4292/13/13/2458