A New Method to Determine the Optimal Thin Layer Ionospheric Height and Its Application in the Polar Regions
The conversion between the line-of-sight slant total electron content (STEC) and the vertical total electron content (VTEC) depends on the mapping function (MF) under the widely used thin layer ionospheric model. The thin layer ionospheric height (TLIH) is an essential parameter of the MF, which aff...
Main Authors: | Hu Jiang, Shuanggen Jin, Manuel Hernández-Pajares, Hui Xi, Jiachun An, Zemin Wang, Xueyong Xu, Houxuan Yan |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-06-01
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Series: | Remote Sensing |
Subjects: | |
Online Access: | https://www.mdpi.com/2072-4292/13/13/2458 |
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