Scaling properties of ballistic nano-transistors
<p>Abstract</p> <p>Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated <it>I</it> <sub>D </sub>- <it>V</it> <sub>D</sub&g...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2011-01-01
|
| Series: | Nanoscale Research Letters |
| Online Access: | http://www.nanoscalereslett.com/content/6/1/365 |
| Summary: | <p>Abstract</p> <p>Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated <it>I</it> <sub>D </sub>- <it>V</it> <sub>D</sub>-traces separating the regimes of classically allowed transport and tunneling transport. In this conference contribution, the relevant physical quantities in our model and its range of applicability are discussed in more detail. Extending the temperature range of our studies it is shown that a close-to-linear thresh-old trace results at room temperatures as well. In qualitative agreement with the experiments the <it>I</it> <sub>D </sub>- <it>V</it> <sub>G</sub>-traces for small drain voltages show thermally activated transport below the threshold gate voltage. In contrast, at large drain voltages the gate-voltage dependence is weaker. As can be expected in our relatively simple model, the theoretical drain current is larger than the experimental one by a little less than a decade.</p> |
|---|---|
| ISSN: | 1931-7573 1556-276X |