Examination of the Reliability of a Robustness Test for the Self-Directed Channel Carbon-Based Memristors by Reading Their DC Resistance
An ideal memristor that has been theoretically predicted almost a half-century ago is a nonlinear power dissipating circuit element. Nowadays, memristive systems such as thin films which are not ideal memristors are also called memristors. Such systems have current-dependent behavior and nonlinear c...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Düzce University
2023-10-01
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| Series: | Düzce Üniversitesi Bilim ve Teknoloji Dergisi |
| Subjects: | |
| Online Access: | https://dergipark.org.tr/tr/download/article-file/2296550 |