Depth-dependent EBIC microscopy of radial-junction Si micropillar arrays
Abstract Recent advances in fabrication have enabled radial-junction architectures for cost-effective and high-performance optoelectronic devices. Unlike a planar PN junction, a radial-junction geometry maximizes the optical interaction in the three-dimensional (3D) structures, while effectively ext...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2020-09-01
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| Series: | Applied Microscopy |
| Subjects: | |
| Online Access: | https://doi.org/10.1186/s42649-020-00037-4 |