Energetic disorder impacts energy-level alignment of alpha-sexithiophene on hydrogen-terminated silicon and silicon oxide
The energy-level alignment at hybrid organic-inorganic interfaces is decisive for the performance of (opto-)electronic devices. We use ultraviolet and x-ray photoelectron spectroscopy (UPS and XPS) to measure the energy-level alignment of vacuum-sublimed α-sexithiophene (6 T) thin films with HF-etch...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2022-01-01
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| Series: | Materials Research Express |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2053-1591/ac8644 |