Evolution of nanoripples on silicon by gas cluster-ion irradiation

Si wafers of (100), (110) and (111) orientations were bombarded by gas cluster ion beam (GCIB) of 3000 Ar-atoms/cluster on average at a series of angles. Similar surface morphology ripples developed in different nanoscales. A simple scaling functional satisfactorily describe the roughness and wavele...

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Main Authors: Omar Lozano, Q. Y. Chen, B. P. Tilakaratne, H. W. Seo, X. M. Wang, P. V. Wadekar, P. V. Chinta, L. W. Tu, N. J. Ho, D. Wijesundera, W. K. Chu
Format: Article
Language:English
Published: AIP Publishing LLC 2013-06-01
Series:AIP Advances
Online Access:http://link.aip.org/link/doi/10.1063/1.4811171
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author Omar Lozano
Q. Y. Chen
B. P. Tilakaratne
H. W. Seo
X. M. Wang
P. V. Wadekar
P. V. Chinta
L. W. Tu
N. J. Ho
D. Wijesundera
W. K. Chu
author_facet Omar Lozano
Q. Y. Chen
B. P. Tilakaratne
H. W. Seo
X. M. Wang
P. V. Wadekar
P. V. Chinta
L. W. Tu
N. J. Ho
D. Wijesundera
W. K. Chu
author_sort Omar Lozano
collection DOAJ
description Si wafers of (100), (110) and (111) orientations were bombarded by gas cluster ion beam (GCIB) of 3000 Ar-atoms/cluster on average at a series of angles. Similar surface morphology ripples developed in different nanoscales. A simple scaling functional satisfactorily describe the roughness and wavelength of the ripple patterns as a function of dosage and angle of incidence. The ripples are formed orthogonal to the incident cluster-ions at large off-normal angles. An ellipsoidal pattern was created by two consecutive irradiations incident in mutually orthogonal directions with unequal exposure times between each irradiation, from 7:1 to 10:1, beyond which the original ripple imprints would be over-written. This work was inspired by use of the ripples to seed growth of controlled nanostructures without patterning by lithography or predeposition of catalysts.
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spelling doaj.art-2df7e8eda4fa46ce930bebc1456f14892022-12-21T23:16:22ZengAIP Publishing LLCAIP Advances2158-32262013-06-013606210706210710.1063/1.4811171Evolution of nanoripples on silicon by gas cluster-ion irradiationOmar LozanoQ. Y. ChenB. P. TilakaratneH. W. SeoX. M. WangP. V. WadekarP. V. ChintaL. W. TuN. J. HoD. WijesunderaW. K. ChuSi wafers of (100), (110) and (111) orientations were bombarded by gas cluster ion beam (GCIB) of 3000 Ar-atoms/cluster on average at a series of angles. Similar surface morphology ripples developed in different nanoscales. A simple scaling functional satisfactorily describe the roughness and wavelength of the ripple patterns as a function of dosage and angle of incidence. The ripples are formed orthogonal to the incident cluster-ions at large off-normal angles. An ellipsoidal pattern was created by two consecutive irradiations incident in mutually orthogonal directions with unequal exposure times between each irradiation, from 7:1 to 10:1, beyond which the original ripple imprints would be over-written. This work was inspired by use of the ripples to seed growth of controlled nanostructures without patterning by lithography or predeposition of catalysts.http://link.aip.org/link/doi/10.1063/1.4811171
spellingShingle Omar Lozano
Q. Y. Chen
B. P. Tilakaratne
H. W. Seo
X. M. Wang
P. V. Wadekar
P. V. Chinta
L. W. Tu
N. J. Ho
D. Wijesundera
W. K. Chu
Evolution of nanoripples on silicon by gas cluster-ion irradiation
AIP Advances
title Evolution of nanoripples on silicon by gas cluster-ion irradiation
title_full Evolution of nanoripples on silicon by gas cluster-ion irradiation
title_fullStr Evolution of nanoripples on silicon by gas cluster-ion irradiation
title_full_unstemmed Evolution of nanoripples on silicon by gas cluster-ion irradiation
title_short Evolution of nanoripples on silicon by gas cluster-ion irradiation
title_sort evolution of nanoripples on silicon by gas cluster ion irradiation
url http://link.aip.org/link/doi/10.1063/1.4811171
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