Error Correction for TLC and QLC NAND Flash Memories Using Cell-Wise Encoding

The growing error rates of triple-level cell (TLC) and quadruple-level cell (QLC) NAND flash memories have led to the application of error correction coding with soft-input decoding techniques in flash-based storage systems. Typically, flash memory is organized in pages where the individual bits per...

Full description

Bibliographic Details
Main Authors: Daniel Nicolas Bailon, Johann-Philipp Thiers, Jürgen Freudenberger
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/11/10/1585