Flash memory cells data loss caused by total ionizing dose and heavy ions

Bibliographic Details
Main Authors:	Petrov Andrey, Vasil’ev Alexey, Ulanova Anastasia, Chumakov Alexander, Nikiforov Alexander
Format:	Article
Language:	English
Published:	De Gruyter 2014-10-01
Series:	Open Physics
Subjects:	flash memory single event upsets total dose
Online Access:	https://doi.org/10.2478/s11534-014-0503-6

Internet