In situ monitoring metal-ligand exchange processes by optical spectroscopy and X-ray diffraction analysis: a review
Knowledge about the mechanisms involved in the structural development of solid materials at the atomic level is essential for designing rational synthesis protocols for these compounds, which may be used to improve desired technical properties, such as light emission, conductivity, magnetism, porosi...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2017-08-01
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| Series: | Reviews in Analytical Chemistry |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/revac-2017-0003 |