unDrift: A versatile software for fast offline SPM image drift correction
Scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2023-12-01
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Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.14.101 |