unDrift: A versatile software for fast offline SPM image drift correction

Scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a...

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Bibliographic Details
Main Authors: Tobias Dickbreder, Franziska Sabath, Lukas Höltkemeier, Ralf Bechstein, Angelika Kühnle
Format: Article
Language:English
Published: Beilstein-Institut 2023-12-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.14.101